- Pickering Interfaces Inc.
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LXI 50Ω 6:1 Microwave Multiplexer 16-bank 40GHz SMA
60-800-416
Our 60-800 Microwave Multiplexer range is suitable for switching 50 ohm signals up to 40GHz. With the capability of supporting up to 16 banks of 6 channel multiplexers it is ideal for constructing complex microwave switching systems for many applications. Connection is by high performance front panel mounted SMA connectors.
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Power System Simulator
F6150sv
This power system simulator performs the simplest through the most complex tests. The F6150sv has the highest output current of any test set on the market – all within a single box.
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Tracer Gas Leak Test Systems
Tracer gas leak testing is a simple and highly-efficient method of leak detection that provides high sensitivity as well as increased accuracy and repeatability. This method is used for testing parts with very low leak rates that are outside the range for conventional air-flow pressure decay and mass flow, or to replace bubble test methods. Tracer gas testing uses escaping tracer gas to identify micro-leaks in the range of 1x10-4 to 10-9 scc/s.
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Redundant Frequency and Timing Systems
A unique feature of our frequency standards and distribution amplifiers is that the two separate parts of the redundant system are identical and can easily be inter-changed, for maintenance purposes. What we mean by this is that that we don't have a "Master" unit and a "Slave" unit. Whatever unit is powered up first becomes the master unit and the other becomes the slave unit.
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Function Test Systems & Equipment
Cincinnati Test Systems (CTS) provides our customers with turnkey systems that include the design, manufacture and support of custom built lean cell and automated functional equipment testing solutions. We are a recognized global leader for providing test solutions integrated with advanced technology, precision instrumentation, information software written by CTS engineers with proven experience, and supported by a team of technical application specialist.
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Low Voltage Burn-in and Test System
Max 450
For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
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Tyre Inspection Systems
The VLT tyre inspection system can check several tyre and wheel related items, such as tread depth and sideslip. All measurements are done very fast when the vehicle is on the roller brake tester.
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Precise Temperature Forcing System
TA-5000A Series
The ThermalAir TA-5000 Series of temperature forcing systems bring precise thermal testing capabilities directly to your test application, exactly localizing to where thermal conditioning temperature cycling is required. ThermalAir TA-5000 temperature systems provide flexible thermal test solutions for an array of products and technologies.
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ThermalAir Series Temperature Forcing System
ThermalAir TA-1000B Rack Mount Test System
The ThermalAir TA-1000B high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -25°C to +200°C.
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Multi-Mission System
Improved Shadow® Tactical Unmanned Aircraft Systems
With more than 30 years of unmanned aircraft systems (UAS) experience, Textron Systems' Shadow® is the most reliable and capable tactical UAS to help you accomplish your missions. The battle-proven system has surpassed 1.25M hours in flight, supporting global military operations for countless U.S. troops and their allies. Our multi-mission systems are paired with Textron Systems' interoperable Universal Ground Control Station (UGCS) and remote products for collaboration across the battle space.
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Circuit Breaker Endurance Test System
Endurance testing involves operating – closing and opening – the circuit breaker repeatedly for a set number of cycles. This test is necessary to stabilize the circuit breaker mechanism and to identify “Early Infant Mortality” failures in the switchgear assembly.
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ATE Test Systems
Introducing the Procyon ATE System! When it comes to ATE Test Systems for a for low- to high-volume production, Intepro has the testing power you require to be successful. For more than three decades, Intepro Systems has designed, built and integrated power supply test equipment for the world’s largest and smallest power supply manufacturers.
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VS200/300 & PC-VS Systems
For Measuring * Impact Velocity - Both Pre and Post * Impact Energy & Loss * Materials Restitution Non-Contacting Optical Sensor:Does not interfere with test machine, compensates for machine friction and air drag.
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Probe System
Acculogic FLS 980 Dxi
Flying Probe systems do not require test fixtures, have few restrictions on board access and can test boards with a virtually unlimited number of networks. They also allow developers to complete test programs in a short time.The FLS980 Dxi guarantees superior probing precision and repeatability, even as component sizes and denser packaging technologies pose challenges to other test engineers.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Advanced Burn-in and Test System for packaged parts
ABTS-Li
High power logic individual temperature control
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Mezzanine System
5676
The Abaco SystemsP/N 5676 ECM module provides eight channels of 16 bit voltage measurement in the 0 to 2.5V volt range. For each channel the common mode voltage range is -100 volts to +100 volts.
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Mezzanine System
5085
ECM P/N 5085 provides two channels of 24 bit A/D conversion suitable for high resolution low speed applications, which include bridge circuits, thermocouples, RTD and voltage measurements. For bridge applications each channel provides a fused +5 Volt or a current source drive.
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Mezzanine System
5047
The 5047 provides breakout of all ECM signals for debug, design validation and development. Plated through holes on the PCB allow soldering of probe wires to IO, Data, Power and Serial Identification signals. LEDs indicate presence of 3V, 5V, +12V, -12V and Ground. Elevates the ECM module by 2 mm and saves wear on the ECM carrier board connectors. Since this is a debug too there is no serial identification circuit.
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Synchronization And ASOPS Systems
The asynchronous optical sampling (ASOPS) technique allows high-speed scanning over some nanoseconds of time delay without a mechanical delay line. The SYNCRO-RRE, also available as stand-alone unit, provides state-of-the art phase lock electronics.
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Other Test Systems
Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.
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Dip Coating Systems
SCS Dip Coating systems, which are available in free-standing floor or tabletop models, are specifically designed for production applications that do not require large in-line systems. SCS dip coating systems can be used to apply a range of coatings, as well as photo-resists and solder masks, that are part of printed circuit board applications all with a level of precision that manufacturer's demand. Both SCS models include a host of features that make them an ideal choice for lab and production operations.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Battery Monitoring System
BMS-3923
Kongter Test & Measurement Co., Limited
This battery monitoring system is an innovative solution to measure battery condition with communication way of Power Line Carrier (PLC). With multi-frequency measurement, users can monitor and analyze battery in all aspects: internal resistance, voltage, current, capacitance, temperature and so on.Based on our years experience for battery management system, we build very mature mathematical model that precisely predicts battery capacity. This will in another hand reduce the time that we spend on capacity measurement using a battery load bank.
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Test Cell Vibration Monitoring System
The Test Cell Vibration Monitoring System is a complete package for monitoring dyno vibration levels generated during engine testing. This system was design to prevent catastrophic dyno failures.
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System Integration
G Systems develops fully integrated systems and we know that both software and hardware are equally important to system design. Our focus on code quality and optimization ensures customers receive efficient and maintainable code. We specialize in LabVIEW development and all of our LabVIEW developers are certified developers or architects. We’re also highly skilled in mechanical and electrical hardware design and builds on a wide variety of data acquisition, signal conditioning, RF, and distributed communication platforms.
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Flash Device Test System
MS7208
The MS7208 system can test a wide range of device families including – but not limited to – NAND flash, NOR flash, multi-level flash, multi-die flash, EEPROM, RAM, and mixed-technology memory devices.
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Computing VITA System
CRS 48.5
The CRS 48.5 is a complete, integrated, pre-tested, ready-to-run HPEC rugged subsystem enabling faster development/deployment at lower cost and risk using the most advanced VITA 48.5 compliant air-flowthrough cooling to allow the integration of up to eight quad core Intel® Core™ i7 processing nodes.
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Integrated Thermal Control System
The Vektrex Integrated Thermal Control System (ITCS) uses proprietary water-based thermal control to maintain consistent LED and laser device temperatures during high power testing applications. LED/VCSEL manufacturers and third-party test facilities standardize on ITCS chambers for their testing needs.
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Handheld Test Systems
Lightweight and easy to use handheld test systems designed with a plug and play approach, ideal when operating on site or close quarters.
